EVENTS
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ISyE Statistics Seminar
GUEST LECTURER
Tirthankar Dasgupta
AFFILIATION
Stewart School of Industrial and Systems Engineering
ABSTRACT
Title: Robust Design, Modeling and Optimization of Measurement Systems
Abstract: In this paper, we discuss an integrated approach for estimation and reduction of measurement variation (and its components) through a single parameter design experiment. The noise factors are classified into a few distinct categories based on their impact on the measurement system. A random coefficients model that accounts for the effect of control factors and each category of noise factors on the signal-response relationship is proposed. A suitable performance measure is developed using this general model, and conditions under which it reduces to the usual dynamic signal-to-noise (SN) ratio are discussed. Two different data analysis strategies -- response function modeling (RFM) and performance measure modeling (PMM) -- for modeling and optimization are proposed and compared.
Tirthankar Dasgupta was a PhD student in ISyE working with Professor Jeff Wu. He is now a postdoc and will join Department of Statistics at Harvard University in the next year.
For Additional information about the ISyE Statisitcs Group, please visit: http://www2.isye.gatech.edu/statistics/seminar_series.php
DATE & TIME
Thursday, September 27, 2007 -- 11:00 AM
DURATION
1 hour
LOCATION
ISyE, Executive Classroom 228, Main
CONTACT PERSON
Xiaoming Huo
RELATED SITE
http://www2.isye.gatech.edu/statistics/seminar_series.php
